ALBANY, New York & MADISON, Wis.--(BUSINESS WIRE)--Bruker AXS, the market leader in X-Ray Diffraction (XRD) instrumentation, is pleased to announce that SEMATECH, the global consortium of ...

SAN FRANCISCO — FEI Co. has joined Sematech's Advanced Metrology Development Program at the College of Nanoscale Science and Engineering (CNSE) of the University at Albany, N.Y. FEI will collaborate ...

PCB designers usually treat metrology as a manufacturing or quality problem that starts after release. That view is now becoming outdated given that more designs deal with fine features and package ...

ALBANY, N.Y.--(BUSINESS WIRE)--In an effort that will accelerate the development of next-generation transistors, SEMATECH announced today that Soitec, a world leader in manufacturing revolutionary ...

“[A] large amount of the federal funding appropriated under the CHIPS and Science Act has already been allocated to some of the biggest names in the chip manufacturing industry.” On April 16, the U.S.

FEI Company and SEMATECH have announced that FEI Company has joined SEMATECH’s Advanced Metrology Development Program at the College of Nanoscale Science and Engineering (CNSE) of the University at ...

The Office of Weights and Measures (OWM) has a staff of 20 individuals and implements its services through four programs: laws and metric, international legal metrology, legal metrology devices, and ...

Laser Thermal, a leading instrument and service provider of small-scale thermal property measurements, is thrilled to announce it has been awarded a contract from the National Institute of Standards ...

The tool enables NIST to measure the thermal conductivity of wide bandgap power electronics materials, packaging materials, and integrated chip components, directly supporting the CHIPS thermal ...